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dc.contributor.authorSouto, Ricardo Manuel 
dc.contributor.authorIzquierdo Pérez, Javier 
dc.contributor.authorEifert, Alexander
dc.contributor.authorKranz, Christine
dc.date.accessioned2020-03-23T13:35:14Z
dc.date.available2020-03-23T13:35:14Z
dc.date.issued2017es_ES
dc.identifier.urihttp://riull.ull.es/xmlui/handle/915/19010
dc.description.abstractThe anodic dissolution of pure copper surfaces in acidic chloride solution has been monitored in-situ using combined atomic force – scanning electrochemical microscopy (AFM-SECM). Here, the initial studies performed on model copper-modified substrates have been extended to the investigation of bulk copper samples used in industrial settings. The local release of Cu2+ ions was monitored through electrochemical reduction and deposition of the metal ions on the conductive frame of the AFM-SECM probe. Simultaneous monitoring of the topographical changes due to the corrosion process allowed the distinction and correlation of local passivation and pitting phenomena. The extent of the attack was estimated by anodic stripping of the copper metal deposited at the probe.en
dc.format.mimetypeapplication/pdf
dc.language.isoenes_ES
dc.relation.ispartofseriesElectrochimica Acta, 247, 588-599 (2017)es_ES
dc.rightsLicencia Creative Commons (Reconocimiento-No comercial-Sin obras derivadas 4.0 Internacional)
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/deed.es_ES
dc.titleIn situ investigation of copper corrosion in acidic chloride solution using atomic force - scanning electrochemical microscopyen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1016/j.electacta.2017.07.042
dc.subject.keywordAFM-SECMen
dc.subject.keywordcopper corrosionen
dc.subject.keywordSG-TC modeen
dc.subject.keywordtip-integrated gold electrodesen


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