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dc.contributor.authorSouto, Ricardo Manuel 
dc.contributor.authorIzquierdo Pérez, Javier 
dc.contributor.authorFernández-Pérez, Bibliana María
dc.contributor.authorEifert, Alexander
dc.contributor.authorKranz, Christine
dc.date.accessioned2020-03-24T13:45:08Z
dc.date.available2020-03-24T13:45:08Z
dc.date.issued2016es_ES
dc.identifier.urihttp://riull.ull.es/xmlui/handle/915/19055
dc.description.abstractCombined atomic force-scanning electrochemical microscopy (AFM-SECM) has been explored for monitoring copper ions generated by dissolution of copper samples while recording induced changes in topography. Released Cu2+ ions were detected via reduction to metallic copper at the AFM tip-integrated electrode followed by subsequent re-dissolution in bulk solution by anodic stripping voltammetry. Copper crystals electrodeposited on gold substrates were used as model systems to demonstrate the laterally resolved analysis of topographical changes and the simultaneous measurement of localized cation release, which was anodically activated upon exposure to acidified chloride-containing solution. Finally, the potential of AFM-SECM for monitoring spatially resolved corrosion processes with sub-micrometer resolution was illustrated using a pure copper sampleen
dc.format.mimetypeapplication/pdf
dc.language.isoenes_ES
dc.relation.ispartofseriesElectrochimica Acta, 201, 320-332 (2016)es_ES
dc.rightsLicencia Creative Commons (Reconocimiento-No comercial-Sin obras derivadas 4.0 Internacional)
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/deed.es_ES
dc.titleSimultaneous atomic force-scanning electrochemical microscopy (AFM-SECM) imaging of copper dissolutionen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1016/j.electacta.2015.12.160
dc.subject.keywordAFM-SECMen
dc.subject.keywordsubstrate generation-tip collection (SG-TG)en
dc.subject.keywordelectrochemistryen
dc.subject.keywordcopper corrosionen
dc.subject.keywordmetal dissolutionen


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