Simultaneous pit generation and visualization of pit topography using combined atomic force-scanning electrochemical microscopy
Complete registryShow full item record
Combined atomic force microscopy – scanning electrochemical microscopy (AFM-SECM) is for the first time used to generate single corrosion pits on passivating iron surfaces in the micrometer range. The AFM-SECM probe locally generates nitric acid during the oxidation of nitrite ions with the release of protons at selected sites on the surface of the otherwise passive metal. High confinement of passive film breakdown is achieved from the combination of a small probe size and the inhibiting properties of non-reacted nitrite ions on the surrounding passivated surface. Simultaneous visualization of pit nucleation and propagation can be obtained in the same solution without changing the probe by AFM.