RT info:eu-repo/semantics/article
T1 Simultaneous atomic force-scanning electrochemical microscopy (AFM-SECM) imaging of copper dissolution
A1 Souto, Ricardo Manuel
A1 Izquierdo Pérez, Javier
A1 Fernández-Pérez, Bibliana María
A1 Eifert, Alexander
A1 Kranz, Christine
K1 AFM-SECM
K1 substrate generation-tip collection (SG-TG)
K1 electrochemistry
K1 copper corrosion
K1 metal dissolution
AB Combined atomic force-scanning electrochemical microscopy (AFM-SECM) has been explored for monitoring copper ions generated by dissolution of copper samples while recording induced changes in topography. Released Cu2+ ions were detected via reduction to metallic copper at the AFM tip-integrated electrode followed by subsequent re-dissolution in bulk solution by anodic stripping voltammetry. Copper crystals electrodeposited on gold substrates were used as model systems to demonstrate the laterally resolved analysis of topographical changes and the simultaneous measurement of localized cation release, which was anodically activated upon exposure to acidified chloride-containing solution. Finally, the potential of AFM-SECM for monitoring spatially resolved corrosion processes with sub-micrometer resolution was illustrated using a pure copper sample
YR 2016
FD 2016
LK http://riull.ull.es/xmlui/handle/915/19055
UL http://riull.ull.es/xmlui/handle/915/19055
LA en
DS Repositorio institucional de la Universidad de La Laguna
RD 08-may-2024