RT info:eu-repo/semantics/article
T1 Optimal lot sentencing based on defective counts and prior acceptability
A1 Suárez Rancel, María Mercedes
A1 Fernández Rodríguez, Arturo Javier
A1 Pérez González, Carlos Javier
A2 MatemáticasEstadística e Investigación Operativa
K1 Quality control
K1 Constrained optimization
K1 Lot sampling inspection
K1 Integer nonlinear programming
K1 Reliability demonstration testing
AB Optimal inspection schemes for lot sentencing based on defective counts and prior lot acceptability, which provide appropriate protections to manufacturers and customers, are derived by minimizing the sampling inspection effort. An efficient computational procedure to determine the best test plan is presented. Moreover, an explicit approximation of the optimal scheme is deduced and its accuracy is analyzed. The achieved results practically solve the underlying constrained optimization problem in closed-form. The developed methodology is applied to the design of reliability demonstration test plans using failure count data and posterior odds ratios. Some illustrative examples are also presented. In most practical cases, the suggested approach is quite robust to small deviations in the prior acceptability, and allows the practitioners to substantially reduce the required sample size for screening lots of incoming and outgoing goods, as well as to appreciably improve the evaluations of the actual producer and consumer risks. Furthermore, it provides straightforward ways to combine multiple expert opinions and to update the optimal inspection scheme using the current estimate of the prior lot acceptability. In addition, the proposed test plans usually outperform the noninformative/frequentist schemes in terms of sampling cost and are quasi-optimal when the previous knowledge is slightly modified
YR 2021
FD 2021
LK http://riull.ull.es/xmlui/handle/915/39830
UL http://riull.ull.es/xmlui/handle/915/39830
LA en
DS Repositorio institucional de la Universidad de La Laguna
RD 25-abr-2025