Impedance data obtained by Electrochemical Impedance Spectroscopy (EIS) are fitted to
a relevant electrical equivalent circuit in order to evaluate parameters directly related to the
resistance and the durability of coated metal systems. An alternative method to non-linear
regression algorithms for the analysis of measured data in terms of equivalent circuit parameters
is provided by evolutionary algorithms, more especially the differential evolution (DE) algorithms
(standard DE and a representative of the self-adaptive DE paradigm were used). Obtained results
with DE algorithms were compared with commercial fitting software achieving a more accurate
solution in all handled cases.
