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dc.contributor.authorSigut Saavedra, Marta 
dc.contributor.authorFelipe, Jonatán
dc.contributor.authorAcosta Sánchez, Leopoldo 
dc.contributor.otherIngeniería Informática y de Sistemas
dc.date.accessioned2023-12-14T21:05:24Z
dc.date.available2023-12-14T21:05:24Z
dc.date.issued2021
dc.identifier.urihttp://riull.ull.es/xmlui/handle/915/34800
dc.description.abstractU-V disparity is a technique that is commonly used to detect obstacles in 3D scenes, modeling them as a set of vertical planes. In this paper, the authors describe the general lines of a method based on this technique for fully reconstructing 3D scenes, and conduct an analytical study of its performance and sensitivity to errors in the pitch angle of the stereoscopic vision system. The equations of the planes calculated for a given error in this angle yield the deviation with respect to the ideal planes (with a zero error in the angle) for a large test set consisting of planes with different orientations, which is represented graphically to analyze the method’s qualitative and quantitative performance. The relationship between the deviation of the planes and the error in the pitch angle is observed to be linear. Two major conclusions are drawn from this study: first, that the deviation between the calculated and ideal planes is always less than or equal to the error considered in the pitch angle; and second, that even though in some cases the deviation of the plane is zero or very small, the probability that a plane of the scene deviates from the ideal by the greatest amount possible, which matches the error in the pitch angle, is very high.en
dc.format.mimetypeapplication/pdf
dc.language.isoen
dc.relation.ispartofseriesSensors 2022, 22, 79
dc.rightsLicencia Creative Commons (Reconocimiento-No comercial-Sin obras derivadas 4.0 Internacional)
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/deed.es_ES
dc.titleInfluence of pitch angle errors in 3D scene reconstruction scene reconstructionen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.3390/s22010079
dc.subject.keywordsensitivity analysisen
dc.subject.keywordU-V disparityen
dc.subject.keyword3D scenes reconstructionen


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